Olympus Confocal microscope LEXT OLS photo Description: Confocal laser scanning microscopes allow for observations of three-dimensional shapes, . Olympus Confocal microscope LEXT OLS Description: Confocal laser scanning microscopes allow for observations of three-dimensional shapes, such as. The Olympus LEXT OLS laser scanning confocal microscope, noncontact, nondestructive 3D observations and measurements are easy to produce. Simply .
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This new system represents a major step forward in the reliability of measuring systems. With other existing instruments, 3D image capturing first requires setting upper and lower import limits according ols3010 the height of the specimen. Setting standards in optical metrology at the PTB. Request a Demo Test your application. Measurement of the inner wall waviness and roughness of a turbocharger housing using a laser microscope.
Basic Principles of Laser Scanning Microscopes. The resolving power is enhanced by confocal optics featuring an optimized circular pinhole and a high speed XY scanner developed from Olympus MEMS technology. Measurement of the difference in angle between two specified regions. Evaluating the lsxt of plastic bottle drinking spouts.
Lining Up an Array of Opportunities.
The future of industrial quality control. Low power and long working distance objectives are also available in this series.
Olympus Lext OLS3100 Manuals
Fast Get reliable data four times faster than our previous model. Looking towards a Future of Affordable Solar Energy. Olympus has made the LEXT brand the focus of its efforts to meet these requirements by developing laser scanning microscopes that combine enhanced ease of use with improved visibility.
Osl3100 Sample Preparation of Stone Tools: Please choose your ol3100 of interest. This new system improves the efficiency of the 3D observation and metrology. Magnification power from x to 14,x satisfies the needs of researchers working between the limits of conventional optical microscopes and scanning electron microscopes SEM.
The 4K scan technology scans 4, pixels — four times more than our ol3100 model — in the X-axis direction. All of the operations and procedures included in a report can be saved as ola3100 template. Surface profile evaluation of materials for lithium-ion battery collectors. Wind Turbine Inspection Solutions.
Olympus: LEXT OLS – Microscopy News
Loading the player… source OLS Measuring the shape of scratches on vehicle-mounted camera lenses. Market growth in related industrial sectors is generating more needs for three-dimensional micro-metrology instruments Advances in technology over the past few years have meanwhile raised the standard of quality management required.
Industrial-leading resolution and repeatability for extremely reliable measurement data. Data acquisition that’s four times faster than our previous model delivers a significant boost to productivity. The measurement performance of all dedicated LEXT objectives is guaranteed, so you can select the one best suited to the sample you’re observing.
Analysis app Simple analysis. Dimensional measurement of perforations on a paper box. Measurement of the step height difference and distance between two specified regions. During the next acquisition, open the saved template. Measuring the volume of adhesive drops. Surface Roughness Evaluation of Memory Cards.
Band scan 1-line data acquisition. Evaluation of the Inner Surface of Cylinder Liners. They can also be rotated to any angle using a mouse.
Conduct the inspection and take measurements. A volume, capacity, surface area, etc. Ideal 3D imaging achievable with a single click 2. The thickness of a thin transparent film can also be measured. Olympus software provides a simple user interface, fast processing and advanced analysis in a single solution. The OLS microscope can detect slopes that are almost vertical as well as very low steps without image correction. Alternative Materials for Alternative Energy.
Since no experienced operation is required to obtain a 3D image, even a first-time user can get results, minimizing measurement errors resulting from operator-related variations.