HEFBT from NEXPERIA >> Specification: Decade Counter, 30 MHz, 1 Gate, 1 Input, 3 V to 15 V, SOIC Technical Datasheet: HEFBT Datasheet. HEFBT, Nexperia Counter ICs 5-STAGE JOHNSON COUNTER datasheet, inventory, & pricing. HEFBT datasheet, HEFBT circuit, HEFBT data sheet: PHILIPS – 5 -stage Johnson counter,alldatasheet, datasheet, Datasheet search site for.
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Measurement points given in Table 9. Short data sheet — A short data sheet is an extract from a full data heg4017bt with the same product type number s and title.
Preliminary [short] data sheet Qualification This document contains data from the preliminary specification. Rename the pins throughout to be consistent with rest of HEF family.
This document supersedes and replaces all information supplied prior to the publication hereof. Revision history Table Exposure to limiting values for extended periods may affect device reliability.
HEFB datasheet & applicatoin notes – Datasheet Archive
For detailed and full information hff4017bt the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. Suitability for datwsheet — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure or malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage.
Package SOT74 removed from Section 4. Test circuit Table In case of any inconsistency or conflict with the short data sheet, the full data sheet shall prevail. The latest product status information is available on the Internet at URL http: NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information.
NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail.
However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. Definitions for test circuit: Dwtasheet outputs are sequential within each stage and from stage to stage, with no dead time except propagation delay.
IEE logic symbol 6. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given datasheett the Characteristics sections of this document is not implied.
Automatic counter code correction is provided by an internal circuit: Static characteristics Table 6. A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information.
For more information, please visit: Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. Dynamic datawheet Table 7.
The content is still under internal review and subject to formal approval, which may result in modifications or additions. When cascading counters, the Q output, which is LOW while the counter is in states 5, 6, 7, 8, and 9, can be used to drive the CP0 input of the next counter.
Limiting values Table 4. Functional description Table 3. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.
Plastic or metal protrusions of 0.
Contact information For more information, please visit: Schmitt trigger action makes the clock inputs highly tolerant of slower datazheet and fall times. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http: Limiting values — Stress above one or more limiting values as defined in the Absolute Maximum Ratings System of IEC may cause permanent damage to the device.
Applications — Applications that are described herein for any of these products datahseet for illustrative purposes only. Dynamic power dissipation PD PD can be calculated from the formulas shown. All referenced brands, product names, service names and trademarks are the property of their respective owners.
HEFBT, – NXP Semiconductors – Free Library Parts
Ordering information Table 1. Product [short] data sheet Production This document contains the product specification.
Recommended operating conditions Table 5.